WebThe first NXT system, the TWINSCAN NXT:1950i, was launched in 2008 and delivered a 30% increase in productivity to over 200 wafers per hour, while also improving overlay to 2.5 … WebThe TWINSCAN NXT:1950i Step-and-Scan system is a high productivity, dual stage immersion lithography tool designed for volume production 300-mm wafers at the 32-nm node and beyond. Building on the successful ...
TWINSCAN:一场持续20年的光刻技术革新 - 知乎 - 知乎专栏
WebThe TWINSCAN XT:870G 248-nm Step-and-Scan system is a high-productivity, dual-stage KrF lithography tool designed for volume 300-mm wafer production at and below 110-nm resolution. Combining the imaging power of a variable 0.55-0.80-NA Carl Zeiss Starlith 870 4X reduction lens with AERIAL II and the optional QUASAR XL Illuminator technology ... WebTWINSCAN XT:1900i paving the way to sub 40nm imaging and double patterning by Christian Wagner, Richard Droste, Jos de Klerk XT:1700i XT:1 00i NA 1.2 1.35 Lens type Catadioptric Illuminator type Polarized Immersion liquid Water Scan speed (mm/s) 550 600 Resolution (nm) 45 40 CD Uniformity (3σ,nm) 2.5 2.0 Dedicated Chuck overlay (99.7%, … razorgage software download
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WebA number of TWINSCAN NXT:1950i have reached the productivity milestone of more than 4,000 wafers in a single day at customer manufacturing sites – one system within 15 days after installation. More than 300 systems processed more than one million wafers each within one year, and four TWINSCAN NXT:1950i systems achieved the milestone of … WebFeb 1, 2010 · ASML's TwinScan NXT:1950i system is a dual-stage, 193-nm immersion lithography tool designed for volume production 300-mm wafers at the 32-nm node and beyond. Building on the in-line catadioptric lens design concept of the XT:1950Hi, the NXT:1950i has a numerical aperture (NA) of 1.35. Web第一套nxt系统twinscan nxt:1950i于2008年推出,其生产率提高了30%,达到每小时200多片,同时还将套刻精度提高到2.5纳米。如今,领先的nxt浸润式系统可以每小时处理295片 … simpsons tapped out christmas peril content